Non destructive wheat spike and grain evaluation

Extract data from seeds from within the spike

Wheat spike and grain trait information is essential for both breeders as researchers.

High quality phenotypic information helps to better understand the internal mechanisms and their interaction to the environment. For breeders it facilitates better targeted yield (related) selections in their breeding programs.

Typically the extraction of these traits is laborious and destructive and often important information, such as seed position, cannot be captured.

With automated X-Ray CT imaging the screening of ears can be done non-destructively and with high throughputs. Additionally many different traits can now be extracted.

Output image samples visualizing individual grains segmented non destructively from whole ear.

Track record

PhenoKey has been working closely together with Fraunhofer IIS in the development and integration of industrial X-RayCT solutions for the agricultural domain.

For the phenotyping of wheat spikes and grains various solutions are available. From stand-alone benchtop scanners to fully automated ultra-high throughput setups that can screen many 1000’s of ears per day.

Some examples of features that can be extracted per spike:

- Number of grains

- Total grain volume

- Total grain weight

For each grain:
- Position on ear
- Volume
- Weight
- Shape
- Density

Additional measurements can be developed upon request.

PhenoCT High throughput wheat ear setup at AAPF Plant Accelerator node, Adelaide Australia

Insight

Non destructively quantify important spike and grain traits

Partnerships

PhenoKey X-RayCT solutions are based on the Fraunhofer developed X-ray capabilities. PhenoKey X-RayCT solutions are based on the Fraunhofer developed X-ray capabilities.